Home About us Editorial board Search Ahead of print Current issue Archives Submit article Instructions Subscribe Contacts Login 
Home Print this page Email this page Small font size Default font size Increase font size Users Online: 396
ARTICLE
Year : 2011  |  Volume : 34  |  Issue : 4  |  Page : 249-252

A study of gamma radiation induced changes in electrical properties of Aℓ/TeO 2 /n-Si/Aℓ mos capacitor for dosimetric applications


1 MPTS, BARC, Mumbai, India
2 Department of Physics, Indian Institute of Technology, Kharagpur, India
3 CTS, BARC, Mumbai, India

Correspondence Address:
G Chourasiya
MPTS, BARC, Mumbai
India
Login to access the Email id

Source of Support: None, Conflict of Interest: None


DOI: 10.4103/0972-0464.106181

Rights and Permissions

The study of the effects of ionizing radiation on MOS devices has been an active area of research due to their wide range applications. Some attempts have recently been made to investigate the influence of ionizing radiation on properties of the MOS capacitor prepared by replacing SiO 2 layer by any metal oxide layer of large band gap and then to understand its response. The effect of gamma radiation on electrical properties of the Aℓ/TeO 2 /n-Si/Aℓ MOS capacitor has been studied in detail for the first time in the present work in order to understand its applicability in the post-exposure gamma radiation dosimetry. The effect of gamma radiation on the real and imaginary parts of the permittivity, dielectric loss, series resistance, ac conductivity and surface state density has been determined. These properties have been obtained by analyzing C-V and G/ω-V characteristics, recorded at a frequency 1.0 MHz of the small ac signal, for the MOS structure exposed to different levels of the gamma radiation dose. The linear variation of the dielectric constant with the gamma radiation dose over a wide range of doses, observed corresponding to the accumulation region of the MOS capacitor, possesses high potential for its application as the post-exposure gamma radiation dosimeter.


[FULL TEXT] [PDF]*
Print this article     Email this article
Next article
Previous article
Table of Contents
Similar in PUBMED
   Search Pubmed for
   Search in Google Scholar for
 Related articles
Citation Manager
Access Statistics
Reader Comments
Email Alert *
Add to My List *
 * Requires registration (Free)
 

 Article Access Statistics
    Viewed1552    
    Printed66    
    Emailed0    
    PDF Downloaded301    
    Comments [Add]    
    Cited by others 2    

Recommend this journal