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Article Cited by others ARTICLE
A study of gamma radiation induced changes in electrical properties of Aℓ/TeO 2 /n-Si/Aℓ mos capacitor for dosimetric applications
Chourasiya G, Maity T K, Sharma S L, Sarkar J, Vyas J C
Year : 2011| Volume: 34| Issue : 4 | Page no: 249-252 | This article has been cited by | | 1 |
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Gamma irradiation effect on the optical properties of tellurium dioxide films |
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